Multiple Wavelength Digital Refractometer ATR-L

Multiple Wavelength Digital Refractometer ATR-L Measurement of the critical angle of total reflection at 7 discrete wavelengths, wavelengths range according to prior agreement Technical data Measuring range: 1.33200 to 1.70000 nD at 589 nm* Resolution: 0.00001 nD Precision: ± 0.0001 at 20°C Temperature control: Internal electronic Peltier thermostat Temperature range: +18°C to +30°C (other ranges on request) Temperature resolution: 0.01°C Temperature accuracy: 0.03°C Ambient temperature: +10°C to +40°C Light source: LED, 7 discrete wavelengths in the range of 500 - 900 nm (others upon request) Filter bandwidth: ± 10 – 15 nm Sensor: High resolution CCD-Array with 2048 elements Prism: Sapphire, scratch-resistant Sample room: Stainless steel, black Delrin, Teflon, FFKM Display: Illuminated LCD, 16 x 16 characters, alphanumeric Data output: RS232 C serial / parallel interface, USB optional Power supply: 90 – 240 V, 48 – 62 Hz Dimensions: Measuring head: 250 x 210 x 210 mm Electronic unit: 225 x 360 x 110 mm Weight: 8 kg (complete unit) * the measuring range depends on the selected wavelength ** the DSR- is only calibrated for all built in wavelengths in the temperature range from +10°C up to +40°C. At temperatures above +40°C the accuracy might be narrowly differ from the expected theoretically values due to non-existence of standards at this temperature ranges. precision approx. 0.001 nD. Customs tariff item : 9027 5000 EU Country of origin : Federal Republic of Germany more